Design Strategies For High-Efficiency Reversible Decoders In Fault-Tolerant Applications

Abstract

This research presents an innovative design methodology for developing generalized n-to-2ⁿ decoder 
circuits using reversible logic principles. The proposed architecture relies exclusively on inherently fault
tolerant reversible gates — primarily the Fredkin gate and the Feynman double gate — which enable built
in error detection and correction capabilities across all levels of the circuit hierarchy. The study introduces 
a systematic, scalable algorithmic approach for constructing these decoders for any number of input lines 
(n). Additionally, it establishes theoretical lower bounds for essential performance parameters such as the 
number of constant inputs, garbage outputs, and quantum cost. These metrics serve as critical benchmarks 
for assessing the efficiency of fault-tolerant reversible decoder designs. Extensive comparative evaluations 
demonstrate that the proposed architecture significantly outperforms existing designs in terms of quantum 
cost, propagation delay, hardware complexity, and overall scalability. The results highlight the potential of 
reversible logic in building efficient, reliable, and future-ready digital systems.